Thin Film Measurement System By Sinsil International

We are engaged in offering excellent quality Thin Film Measurement System to our valuable clients.
Table top mapping and insitu version.
Visible : 15nm to 70 um, 380nm - 1050nm, UV : 1nm to 70um, 200nm - 1100nm, NIR : 100nm to 250um, 950nm - 1700nm.
Simultaneous Reflectance/Transmittance Measurements for Thin-Film Applications
The F10-RT requires only a mouse-click to capture both reflectance and transmittance spectra by eliminating timeconsuming changes in hardware configuration. Data capture is fast a the array-based spectrometers typically take less than a second. he Analysis Advantage
The F10-RT brings the power of Filmetrics analysis to simultaneous reflectance and transmittance measurements. A click of the mouse instantly reports minimum and maximum reflectance and transmittance values in user-configurable wavelength ranges. Color analysis is standard and can be displayed in common color-space systems (e.g. CIELAB and CIEXYZ) as well as visually. Measured spectra and other data can easily be printed and exported or can be saved in JPEG image format for easy distribution. Optional film thickness and index solving modules give the F10-RT all of the advanced multi-film analytical power of the Filmetrics F20.
All in a Robust, Reliable Package
The F10-RT arrives complete with reference standards. Its small footprint and USB connectivity ensure effortless setup. With no moving parts, no maintenance other than lamp replacement is necessary and high reliability is guaranteed.