These Proforma 200SA Wafer Thickness and Shape Measurement Tools is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 75 to 200 mm. wafers, the 200SA provides highly accurate, repeatable measurements of thickness, TTV, bow,

These Proforma 300SA Wafer Thickness and Shape Measurement Tool is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 150 to 300 mm. wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow,

We are instrumental in trading a qualitative range of Measuring Tools including Proforma 200SA Wafer Thickness and Shape Measurement Tools, Proforma 300sa Wafer Thickness And Shape Measurement Tool etc.

MTI Instruments - Exporter of Measuring Tools, from Albany, New York, United States.

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Proforma 200SA Wafer Thickness and Shape Measurement Tools

Proforma 300sa Wafer Thickness And Shape Measurement Tool