Spectroscopic Ellipsometer

Our organization is one of the prominent names involved in offering a wide range of Spectroscopic Ellipsometer. Manufactured at par with the set industry norms, these products are durable and can withstand high pressure. Features like corrosion resistance, durability and high tensile strength distinguish our range from others available in the market.

SPECEL-2000-VIS-NIR
Wavelength 450-1000 nm, thickness 1nm...10I m, resolution 0,1 nm, analyzer for refractive index (n) and extinction coefficients (k) as a function of wavelength, measurement speed 3-10 seconds, repeatability 70 nm SiO2 on Si: 1A , controller unit included

SPECEL-2000-UV-VIS-NIR
Wavelength 300-1000 nm, thickness 1nm...10I m, resolution 0,1 nm, analyzer for refractive index (n) and extinction coefficients (k) as a function of wavelength, measurement speed 3-10 seconds, repeatability 70 nm SiO2 on Si: 1A , controller unit included