Veeco Bruker Di Dimension 3100 Afm Atomic Force Microscope

We are engaged in offering excellent quality Veeco Bruker DI Dimension 3100 AFM Atomic Force Microscope to our valuable clients.

Applications : Some of these applications may require the purchase of special cantilevers, cantilever holders, etc.
* Contact AFM
* Tapping AFM
* Lateral Force AFM
* STM (needs a tip holder)
* Magnetic Force Microscopy
* Veeco's ScanAsyst / PeakForce Tapping
* Fluid Imaging
* Veeco's QNM (nanomechanical mapping)
* Surface Potential / Scanning Kelvin Probe Microscopy
* Phase Imaging
* LiftMode (enables MFM/EFM)
* Force curve and pulling
* Torsional Resonance Mode
* Piezo Response

Scanner range : 90Aum by 90Aum
Resolution : Heavily sample and technique dependent
Accessories:-
* High Efficiency Direct Drive Tapping Mode Cantilever Holder for Scanning in Fluid
* Vibration isolation system and environmental enclosure for high-resolution imaging
* Digital image acquisition of optical microscope images

Sample Requirements:-
* The sample vacuum platen can take up to 200mm diameter samples.
* The maximum Z scanning height is of the order of 5Aum.
* The maximum height of a sample is of the order of 12mm.

Clients can avail this Veeco Bruker DI Dimension 3100 AFM Atomic Force Microscope at industry leading prices from us.